Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US13058054Application Date: 2009-08-25
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Publication No.: US08525108B2Publication Date: 2013-09-03
- Inventor: Yuichiro Hashimoto , Hideki Hasegawa , Masuyuki Sugiyama
- Applicant: Yuichiro Hashimoto , Hideki Hasegawa , Masuyuki Sugiyama
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2008-220788 20080829
- International Application: PCT/JP2009/004085 WO 20090825
- International Announcement: WO2010/023873 WO 20100304
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
The mass spectrometer is characterized in that a linear ion trap, that consists of electrodes for mass-selective discharge, is provided with a mechanism that excites ions in a first direction that is perpendicular to the rod axes and a mechanism that simultaneously generates an electric field on the axes in a second direction that is perpendicular to the axial direction and the first direction in order to generate an electric field on the central axis. Highly efficient, high-speed scanning can be achieved using this configuration.
Public/Granted literature
- US20110133075A1 MASS SPECTROMETER Public/Granted day:2011-06-09
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