Invention Grant
US08525125B1 Liquid metal ion source and secondary ion mass spectrometric method and use thereof 有权
液态金属离子源和二次离子质谱法及其应用

Liquid metal ion source and secondary ion mass spectrometric method and use thereof
Abstract:
A liquid metal ion source for use in an ion mass spectrometric analysis method contains, on the one hand, a first metal with an atomic weight ≧190 U and, on the other hand, another metal with an atomic weight ≦90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
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