Invention Grant
- Patent Title: Liquid metal ion source and secondary ion mass spectrometric method and use thereof
- Patent Title (中): 液态金属离子源和二次离子质谱法及其应用
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Application No.: US13832684Application Date: 2013-03-15
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Publication No.: US08525125B1Publication Date: 2013-09-03
- Inventor: Felix Kollmer , Peter Hoerster , Andreas Duetting
- Applicant: Felix Kollmer , Peter Hoerster , Andreas Duetting
- Applicant Address: DE Muenster
- Assignee: ION-TOF Technologies GmbH
- Current Assignee: ION-TOF Technologies GmbH
- Current Assignee Address: DE Muenster
- Agency: Eckert Seamans Cherin & Mellott, LLC
- Agent Karl F. Milde, Jr.
- Priority: EP07021097 20071029
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J27/02

Abstract:
A liquid metal ion source for use in an ion mass spectrometric analysis method contains, on the one hand, a first metal with an atomic weight ≧190 U and, on the other hand, another metal with an atomic weight ≦90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
Public/Granted literature
- US20130216427A1 LIQUID METAL ION SOURCE AND SECONDARY ION MASS SPECTROMETRIC METHOD AND USE THEREOF Public/Granted day:2013-08-22
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