Invention Grant
- Patent Title: Capacitor structure and method of forming the same
- Patent Title (中): 电容器结构及其形成方法
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Application No.: US13532792Application Date: 2012-06-26
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Publication No.: US08525296B1Publication Date: 2013-09-03
- Inventor: Yung-Chang Lin , Chien-Li Kuo
- Applicant: Yung-Chang Lin , Chien-Li Kuo
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
The present invention provides a capacitor structure, comprising a substrate, a TSV, a dielectric layer and a doped region. The substrate includes a first surface and a second surface, which are disposed oppositely to each other. The TSV penetrates through the first surface and the second surface. The dielectric layer is disposed in the substrate and encompasses the TSV. The doped region is disposed between the dielectric layer and the substrate. The present invention further provides a method of forming the same.
Information query
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