Invention Grant
- Patent Title: Ion sources for improved ionization
- Patent Title (中): 用于改善电离的离子源
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Application No.: US13251886Application Date: 2011-10-03
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Publication No.: US08530832B2Publication Date: 2013-09-10
- Inventor: Alexander Mordehai , Mark H. Werlich , Craig P. Love , James L. Bertsch
- Applicant: Alexander Mordehai , Mark H. Werlich , Craig P. Love , James L. Bertsch
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01J49/10
- IPC: H01J49/10 ; H01J27/02
Abstract:
Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry.
Public/Granted literature
- US20120025071A1 Ion Sources for Improved Ionization Public/Granted day:2012-02-02
Information query
