Invention Grant
- Patent Title: Electrical interconnect forming method
- Patent Title (中): 电互连成型方法
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Application No.: US12787527Application Date: 2010-05-26
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Publication No.: US08541299B2Publication Date: 2013-09-24
- Inventor: Stephen Leslie Buchwalter , Bruce K. Furman , Peter A. Gruber , Jae-Woong Nah , Da-Yuan Shih
- Applicant: Stephen Leslie Buchwalter , Bruce K. Furman , Peter A. Gruber , Jae-Woong Nah , Da-Yuan Shih
- Applicant Address: US CA San Jose
- Assignee: Ultratech, Inc.
- Current Assignee: Ultratech, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Peters Verny, LLP
- Agent Allston L. Jones
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/48

Abstract:
An electrical interconnect forming method. The electrical interconnect includes a first substrate comprising a first electrically conductive pad, a second substrate comprising a second electrically conductive pad, and an interconnect structure electrically and mechanically connecting the first electrically conductive pad to the second electrically conductive pad. The interconnect structure comprises a non-solder metallic core structure, a first solder structure, and a second solder structure. The first solder structure electrically and mechanically connects a first portion of the non-solder metallic core structure to the first electrically conductive pad. The second solder structure electrically and mechanically connects a second portion of the non-solder metallic core structure to the second electrically conductive pad.
Public/Granted literature
- US20100230475A1 ELECTRICAL INTERCONNECT FORMING METHOD Public/Granted day:2010-09-16
Information query
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