Invention Grant
- Patent Title: Micro-reflectron for time-of-flight mass spectrometer
- Patent Title (中): 微反射仪用于飞行时间质谱仪
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Application No.: US13366701Application Date: 2012-02-06
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Publication No.: US08552367B2Publication Date: 2013-10-08
- Inventor: Jean-Sebastien Danel , Laurent Duraffourg , Frederic Progent , Charles-Marie Tassetti
- Applicant: Jean-Sebastien Danel , Laurent Duraffourg , Frederic Progent , Charles-Marie Tassetti
- Applicant Address: FR Paris
- Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
- Current Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Brinks Hofer Gilson & Lione
- Priority: FR1150971 20110207
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
A micro-reflectron for a time-of-flight mass spectrometer including a substrate and integrated with the volume of the substrate, means for application of a potential gradient in a volume suitable for constituting a flight zone of the ions. The means of application includes at least two polarization electrodes and a wall of at least one resistive material that can be polarized between these electrodes so as to generate a continuous potential gradient, itself providing the function of reflectron, this flight zone, these electrodes and this wall being obtained by the technology of microelectromechanical systems (MEMS) and this micro-reflectron having a thickness of less than 5 millimeters while its other dimensions are less than 10 times this thickness.
Public/Granted literature
- US20120199736A1 MICRO-REFLECTRON FOR TIME-OF-FLIGHT MASS SPECTROMETER Public/Granted day:2012-08-09
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