Invention Grant
US08573404B2 Continuous particle and macro-molecular zeta potential measurements using field flow fractionation combined micro-electrophoresis 有权
连续粒子和大分子ζ电位测量使用场流分离联合微电泳

  • Patent Title: Continuous particle and macro-molecular zeta potential measurements using field flow fractionation combined micro-electrophoresis
  • Patent Title (中): 连续粒子和大分子ζ电位测量使用场流分离联合微电泳
  • Application No.: US12972318
    Application Date: 2010-12-17
  • Publication No.: US08573404B2
    Publication Date: 2013-11-05
  • Inventor: Fraser McNeil-Watson
  • Applicant: Fraser McNeil-Watson
  • Applicant Address: GB Malvern
  • Assignee: Malvern Instruments, Ltd.
  • Current Assignee: Malvern Instruments, Ltd.
  • Current Assignee Address: GB Malvern
  • Agent Kristofer E. Elbing
  • Main IPC: B03B5/00
  • IPC: B03B5/00
Continuous particle and macro-molecular zeta potential measurements using field flow fractionation combined micro-electrophoresis
Abstract:
In one general aspect, an instrument for measuring characteristics of particles suspended in a fluid is disclosed. It includes a closed wall surface defining a fractionation channel having a input opening, an output opening, and a flow axis that spans downstream from the input opening for the channel to the output opening. A force application subsystem has a force application output oriented perpendicular to at least part of the flow axis of the fractionation channel. A particle characteristic measurement subsystem is located hydraulically downstream from at least a portion of the closed wall surface defining the fractionation channel, and includes a sensor positioned to sense a property of the suspended particles in the potential measurement subsystem as well as a signal output responsive to the sensor. A result processor has a signal input responsive to the signal output of the particle characteristic measurement subsystem, zeta potential processing logic responsive to the particle characteristic measurement subsystem, and a particle characteristic signal output responsive to the particle characteristic processing logic.
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