Invention Grant
- Patent Title: Phase detection of Raman scattered light
- Patent Title (中): 拉曼散射光的相位检测
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Application No.: US13016395Application Date: 2011-01-28
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Publication No.: US08582097B2Publication Date: 2013-11-12
- Inventor: Alexandre M. Bratkovski , Igor Lukyanchuk
- Applicant: Alexandre M. Bratkovski , Igor Lukyanchuk
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01J3/44
- IPC: G01J3/44

Abstract:
An apparatus for phase detection of Raman scattered light emitted from a sample includes a first polarizer positioned along a first optical path containing a first beam and a second polarizer positioned along a second optical path containing a second beam. The first polarizer and second polarizer polarize the first beam and the second beam in one of mutually perpendicular and mutually parallel first and second directions. The apparatus also includes an optical phase modulator positioned along the second optical path to controllably modulate a phase of the second beam, a beam splitter positioned to join the first beam and the second beam together, and a spectrometer to receive the joined first beam and second beam and to measure a phase shift of the first beam and the second beam.
Public/Granted literature
- US20120194812A1 PHASE DETECTION OF RAMAN SCATTERED LIGHT Public/Granted day:2012-08-02
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