Invention Grant
- Patent Title: Method and circuitry for debugging a power-gated circuit
- Patent Title (中): 用于调试电源门控电路的方法和电路
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Application No.: US13184982Application Date: 2011-07-18
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Publication No.: US08595563B2Publication Date: 2013-11-26
- Inventor: Benjamin Tsien , Kiran Bondalapati , Hao Huang , William A. Hughes , Eric Rentschler , Jeremy Schreiber , Aaron J. Grenat
- Applicant: Benjamin Tsien , Kiran Bondalapati , Hao Huang , William A. Hughes , Eric Rentschler , Jeremy Schreiber , Aaron J. Grenat
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Volpe and Koenig, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Described are a circuit and a method of analyzing and correcting a fault occurring in operation of the circuit during a power gating sequence. The method includes executing a modification of the power gating sequence that includes maintaining operation of a trace capture buffer (TCB); recording, in the TCB, events occurring during the executing; and correcting the fault based on analysis of the events recorded in the TCB. The circuit includes a plurality of components including a TCB, and a switch configured to maintain power to the TCB in a first state and turn off power to the TCB in a second state.
Public/Granted literature
- US20130024829A1 METHOD AND CIRCUITRY FOR DEBUGGING A POWER-GATED CIRCUIT Public/Granted day:2013-01-24
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