Invention Grant
- Patent Title: Method for making photomask layout
- Patent Title (中): 制作光掩模布局的方法
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Application No.: US13754257Application Date: 2013-01-30
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Publication No.: US08627242B1Publication Date: 2014-01-07
- Inventor: Hui-Fang Kuo , Ming-Jui Chen , Cheng-Te Wang
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method for making a photomask layout is provided. A first graphic data of a photomask is provided, wherein the first graphic data includes a first line with a first line end target, a second line with a second line end target and a hole, the first line is aligned with the second line, and the first line, the second line and the hole partially overlap with each other. Thereafter, a retarget step is performed to the first graphic data to obtain a second graphic data, wherein the retarget step includes moving the first line end target and the second line end target in opposite directions away from each other.
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