Invention Grant
- Patent Title: Methods and apparatus for determining characteristics of particles
- Patent Title (中): 确定颗粒特性的方法和装置
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Application No.: US12784719Application Date: 2010-05-21
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Publication No.: US08634072B2Publication Date: 2014-01-21
- Inventor: Michael Trainer
- Applicant: Michael Trainer
- Agent William H. Eilberg
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N21/00

Abstract:
An instrument for measuring characteristics of a particle sample by counting and classifying particles into selected ranges of particle characteristics. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles of interest at one time is reduced to an acceptable level. A light beam is projected through a sample space, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle characteristics. So both the decrease in the beam intensity, due to light removal by the particle, and light scattered by the particle, may be used to determine the particle characteristics, to classify the particle and count it in a certain range of particle characteristics.
Public/Granted literature
- US20100225913A1 METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES Public/Granted day:2010-09-09
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