Invention Grant
- Patent Title: Scanning incremental focus microscopy
- Patent Title (中): 扫描增量聚焦显微镜
-
Application No.: US12911334Application Date: 2010-10-25
-
Publication No.: US08669524B2Publication Date: 2014-03-11
- Inventor: Eric Lifshin , Michael Stessin , Isaak Chagouel
- Applicant: Eric Lifshin , Michael Stessin , Isaak Chagouel
- Applicant Address: US NY Albany
- Assignee: The Reseach Foundation of State University of New York
- Current Assignee: The Reseach Foundation of State University of New York
- Current Assignee Address: US NY Albany
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Brenda Birken, Esq.; Matthew M. Hulihan, Esq.
- Main IPC: G01N23/225
- IPC: G01N23/225 ; H01J37/28 ; H01J37/26 ; H01J31/28

Abstract:
Method and apparatus are provided for generating an enhanced image of an object. The method includes obtaining images of an area of an object generated using a probe of having a probe size greater than or equal to a minimum probe area size. An enhanced image of the area of the object is generated by accurately computing the emission intensities emitted from pixel areas smaller than the minimum probe size and within the area of the object. This is repeated for other areas of the object to form other enhanced images. The enhanced images are combined to form an accurate enhanced image of the object.
Public/Granted literature
- US20120097848A1 SCANNING INCREMENTAL FOCUS MICROSCOPY Public/Granted day:2012-04-26
Information query