Invention Grant
- Patent Title: Method of fabricating alignment layer of liquid crystal display device and testing the alignment layer
- Patent Title (中): 制作液晶显示装置取向层的方法和测试取向层
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Application No.: US12346079Application Date: 2008-12-30
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Publication No.: US08685496B2Publication Date: 2014-04-01
- Inventor: Musun Kwak , Jae-Ha Choi , Hanrok Chung
- Applicant: Musun Kwak , Jae-Ha Choi , Hanrok Chung
- Applicant Address: KR Seoul
- Assignee: LG Display Co., Ltd.
- Current Assignee: LG Display Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Brinks, Gilson & Lione
- Priority: KR10-2007-0141972 20071231
- Main IPC: B05D3/02
- IPC: B05D3/02
Abstract:
An alignment layer is tested using an AFM (Atomic Force Microscope) and a FT-IR (Fourier Transformation Infrared Spectroscope) under various process conditions so that inferiority of the alignment layer can be detected and optimum process conditions can be obtained, thereby minimizing the inferiority of the alignment layer by applying the optimum process conditions.
Public/Granted literature
- US20090169754A1 METHOD OF FABRICATING ALIGNMENT LAYER OF LIQUID CRYSTAL DISPLAY DEVICE AND TESTING THE ALIGNMENT LAYER Public/Granted day:2009-07-02
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