Invention Grant
- Patent Title: Method for the spatially resolved measurement of parameters in a cross section of a beam bundle of high-energy radiation of high intensity
- Patent Title (中): 用于空间分辨测量高强度高能辐射束束横截面参数的方法
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Application No.: US13307244Application Date: 2011-11-30
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Publication No.: US08686372B2Publication Date: 2014-04-01
- Inventor: Thomas Missalla , Max Christian Schuermann , Denis Bolshukhin , Boris Tkachenko
- Applicant: Thomas Missalla , Max Christian Schuermann , Denis Bolshukhin , Boris Tkachenko
- Applicant Address: JP Tokyo-to
- Assignee: USHIO Denki Kabushiki Kaisha
- Current Assignee: USHIO Denki Kabushiki Kaisha
- Current Assignee Address: JP Tokyo-to
- Agency: Patentbar International, P.C.
- Priority: DE102010053323 20101202
- Main IPC: G01T1/29
- IPC: G01T1/29

Abstract:
Spatial acquisition of measurement data over a cross section of a high-energy, high-intensity radiation beam bundle without impairment of measuring accuracy due to saturation or degradation of detectors occurs by imaging an entire cross section of the beam bundle on a shading element, the cross section being separated successively into partial beam bundles having reduced cross sections and reduced intensity through movement of at least one opening, whereby measurement values of the partial beam bundles passing the opening are associated temporally and spatially with positions of the opening.
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