Invention Grant
US08689081B2 Techniques for embedded memory self repair 有权
嵌入式内存自我修复技术

Techniques for embedded memory self repair
Abstract:
Techniques are provided for classifying and correcting errors in a bit sequence. At a memory control device, access is requested to a first bit sequences that is stored in a bit sequence database of a memory component and associated with an address. An error is detected in the first bit sequence, and the address associated with the bit sequence is compared to addresses stored in an address database of a content addressable memory component to determine if there is a match. When there is a match, the error is classified as a hard bit error. When there is not a match, the error is classified as a soft bit error.
Public/Granted literature
Information query
Patent Agency Ranking
0/0