Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US13332438Application Date: 2011-12-21
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Publication No.: US08692191B2Publication Date: 2014-04-08
- Inventor: Junkei Kou
- Applicant: Junkei Kou
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2010-290100 20101227
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
A mass spectrometer having first and second mass analyzers for selecting first and second desired ions and a controller that provides control such that those of the first desired ions which have larger masses have larger kinetic energies in the direction of the optical axis in the first mass analyzer and that those of the second desired ions which have larger masses have larger kinetic energies in the direction of the optical axis in the second mass analyzer.
Public/Granted literature
- US20120160998A1 Mass Spectrometer Public/Granted day:2012-06-28
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