Invention Grant
- Patent Title: Examination kit for polarized lens
- Patent Title (中): 偏光镜检查套件
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Application No.: US13299344Application Date: 2011-11-17
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Publication No.: US08699010B2Publication Date: 2014-04-15
- Inventor: Zhao Zhigang , Yin Feng
- Applicant: Zhao Zhigang , Yin Feng
- Applicant Address: US CA Novato
- Assignee: Zenni Optical, Inc.
- Current Assignee: Zenni Optical, Inc.
- Current Assignee Address: US CA Novato
- Agency: Allman & Nielsen, P.C.
- Agent Steven A. Nielsen
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01B9/00

Abstract:
An examination kit allows for discovery of the axis of direction and stress areas of polarized lenses. The kit comprises a lower light box with a transparent work surface, two polarized film sheets, a dial gauge with notches defining allowable variation of axis direction and an upper polarized lens for viewing the tested polarized lens in various states and positions.
Public/Granted literature
- US20120300193A1 Examination Kit for Polarized Lens Public/Granted day:2012-11-29
Information query