Invention Grant
- Patent Title: Direct impact ionization (DII) mass spectrometry
- Patent Title (中): 直接冲击电离(DII)质谱
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Application No.: US13271182Application Date: 2011-10-11
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Publication No.: US08704169B2Publication Date: 2014-04-22
- Inventor: Pierre Alusta , Cameron Dorey , William Ryan Parker , Jon G. Wilkes , Dan Buzatu
- Applicant: Pierre Alusta , Cameron Dorey , William Ryan Parker , Jon G. Wilkes , Dan Buzatu
- Applicant Address: US DC Washington
- Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
- Current Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
- Current Assignee Address: US DC Washington
- Agency: Klarquist Sparkman, LLP
- Main IPC: H01J49/04
- IPC: H01J49/04 ; H01J49/12

Abstract:
Disclosed is a mass spectrometer for analyzing a sample that has or is suspected of having microorganisms. The disclosed mass spectrometer has been uniquely configured to include a sample platform which functions as a counter electrode or discharge electrode and a surface to provide the sample to be analyzed. The mass spectrometer also includes an ion source positioned adjacent to the sample platform for ionizing and volatizing molecules within the sample, wherein the sample platform and the ion source are positioned such that during operation of the mass spectrometer an electrical discharge takes place between the ion source and the sample platform. Also disclosed are methods for generating a mass spectrum profile/fingerprint of a sample. The methods include positioning a sample platform having a sample adjacent to an ion source.
Public/Granted literature
- US20130087700A1 DIRECT IMPACT IONIZATION (DII) MASS SPECTROMETRY Public/Granted day:2013-04-11
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