Invention Grant
- Patent Title: Combination microscopy
- Patent Title (中): 组合显微镜
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Application No.: US13127427Application Date: 2009-10-28
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Publication No.: US08704196B2Publication Date: 2014-04-22
- Inventor: Ralf Wolleschensky , Ingo Kleppe , Gerhard Krampert , Michael Kempe
- Applicant: Ralf Wolleschensky , Ingo Kleppe , Gerhard Krampert , Michael Kempe
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Patterson Thuente Pedersen, P.A.
- Priority: DE102008054317 20081103
- International Application: PCT/EP2009/007693 WO 20091028
- International Announcement: WO2010/060515 WO 20100603
- Main IPC: G01J1/58
- IPC: G01J1/58

Abstract:
A method for generating an image of a sample by a microscopy method including varying local resolution, wherein at least two of the following microscopy methods are combined: laser scanning microscopy, a microscopy method wherein the sample is excited to luminescence by structured line or wide area illumination, and a first microscopy image is generated from the images thus obtained, having increased local resolution greater than the optical resolution of the image, a further microscopy method according to the PAL principle, by which a second microscopy image is generated, indicating geometric locations of marker molecules emitting luminescent radiation at an increased local resolution relative to the optical resolution, and a further microscopy method, wherein the sample is marked using marking molecules suitable for the STED, ESA, or RESOLFT technique, and a third microscopy image is generated of STED, ESA, or RESOLFT, wherein the obtained images are superimposed.
Public/Granted literature
- US20110284767A1 COMBINATION MICROSCOPY Public/Granted day:2011-11-24
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