Invention Grant
- Patent Title: Sample analysis and ion detection
- Patent Title (中): 样品分析和离子检测
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Application No.: US13850769Application Date: 2013-03-26
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Publication No.: US08716653B2Publication Date: 2014-05-06
- Inventor: Herbert H Hill, Jr. , Eric J. Davis , William F. Siems
- Applicant: Herbert H Hill, Jr. , Eric J. Davis , William F. Siems
- Applicant Address: US WA Pullman
- Assignee: Washington State University
- Current Assignee: Washington State University
- Current Assignee Address: US WA Pullman
- Agency: Liang IP, PLLC
- Main IPC: H01J49/02
- IPC: H01J49/02 ; H01J49/26

Abstract:
Various embodiments of ion detection systems, devices, and associated methods of operation are described herein. In one embodiment, a method for ion detection includes separating a target species from other species in an ionized sample of a first polarity, generating ions of a second polarity opposite the first polarity, and contacting ions of the second polarity with the ionized sample to generate emissions after separating the target species from other species in the ionized sample. The method also includes detecting the generated emissions when combining the ionized sampled of the first polarity with the ions of the second polarity.
Public/Granted literature
- US20130256525A1 SAMPLE ANALYSIS AND ION DETECTION Public/Granted day:2013-10-03
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