Invention Grant
- Patent Title: Dual-port measurements of light reflected from micromirror array
- Patent Title (中): 从微镜阵列反射的光的双端口测量
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Application No.: US14017834Application Date: 2013-09-04
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Publication No.: US08717466B2Publication Date: 2014-05-06
- Inventor: Richard G. Baraniuk , Kevin F. Kelly , Robert F. Bridge , Sujoy Chatterjee , Lenore McMackin
- Applicant: InView Technology Corporation
- Applicant Address: US TX Austin
- Assignee: InView Technology Corporation
- Current Assignee: InView Technology Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark K. Brightwell
- Main IPC: H04N9/097
- IPC: H04N9/097 ; H04N5/225

Abstract:
An imaging system and method that captures compressive sensing (CS) measurements of a received light stream, and also obtains samples of background light level (BGLL). The BGLL samples may be used to compensate the CS measurements for variations in the BGLL. The system includes: a light modulator to spatially modulate the received light stream with spatial patterns, and a lens to concentrate the modulated light stream onto a light detector. The samples of BGLL may be obtained in various ways: (a) injecting calibration patterns among the spatial patterns; (b) measuring complementary light reflected by digital micromirrors onto a secondary output path; (c) separating and measuring a portion of light from the optical input path; (d) low-pass filtering the CS measurements; and (e) employing a light power meter with its own separate input path. Also, the CS measurements may be high-pass filtered to attenuate background light variation.
Public/Granted literature
- US20140009638A1 Dual-Port Measurements of Light Reflected from Micromirror Array Public/Granted day:2014-01-09
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