Invention Grant
US08725748B1 Method and system for storing and retrieving semiconductor tester information
有权
存储和检索半导体测试仪信息的方法和系统
- Patent Title: Method and system for storing and retrieving semiconductor tester information
- Patent Title (中): 存储和检索半导体测试仪信息的方法和系统
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Application No.: US10929038Application Date: 2004-08-27
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Publication No.: US08725748B1Publication Date: 2014-05-13
- Inventor: Srikanth Sundararajan , Siu May Ho , Shivananda S. Shetty
- Applicant: Srikanth Sundararajan , Siu May Ho , Shivananda S. Shetty
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Farjami & Farjami LLP
- Main IPC: G06F17/30
- IPC: G06F17/30
Abstract:
A tester information tester information processing system provides test equipment for generating test data. A markup language encoder connected to the test equipment encodes the test data for storage in an object-oriented database management system connected to the markup language encoder, and a user interface is operatively connected to the object-oriented database management system for retrieval of the test data.
Information query
