Invention Grant
- Patent Title: Method of manufacturing dual damascene structure
- Patent Title (中): 双镶嵌结构的制造方法
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Application No.: US13526554Application Date: 2012-06-19
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Publication No.: US08735295B2Publication Date: 2014-05-27
- Inventor: Chang-Hsiao Lee , Hsin-Yu Chen , Yu-Tsung Lai , Jiunn-Hsiung Liao , Shih-Chun Tsai
- Applicant: Chang-Hsiao Lee , Hsin-Yu Chen , Yu-Tsung Lai , Jiunn-Hsiung Liao , Shih-Chun Tsai
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
A method for fabricating a dual damascene structure includes the following steps. At first, a dielectric layer, a dielectric mask layer and a metal mask layer are sequentially formed on a substrate. A plurality of trench openings is formed in the metal mask layer, and a part of the metal mask layer is exposed in the bottom of each of the trench openings. Subsequently, a plurality of via openings are formed in the dielectric mask layer, and a part of the dielectric mask layer is exposed in a bottom of each of the via openings. Furthermore, the trench openings and the via openings are transferred to the dielectric layer to form a plurality of dual damascene openings.
Public/Granted literature
- US20130337650A1 METHOD OF MANUFACTURING DUAL DAMASCENE STRUCTURE Public/Granted day:2013-12-19
Information query
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