Invention Grant
US08735823B2 Terahertz-wave element, terahertz-wave detecting device, terahertz time-domain spectroscopy system, and tomography apparatus 有权
太赫兹波元件,太赫波检测装置,太赫兹时域光谱系统和层析成像装置

  • Patent Title: Terahertz-wave element, terahertz-wave detecting device, terahertz time-domain spectroscopy system, and tomography apparatus
  • Patent Title (中): 太赫兹波元件,太赫波检测装置,太赫兹时域光谱系统和层析成像装置
  • Application No.: US13979624
    Application Date: 2012-01-10
  • Publication No.: US08735823B2
    Publication Date: 2014-05-27
  • Inventor: Toshihiko Ouchi
  • Applicant: Toshihiko Ouchi
  • Applicant Address: JP Tokyo
  • Assignee: Canon Kabushiki Kaisha
  • Current Assignee: Canon Kabushiki Kaisha
  • Current Assignee Address: JP Tokyo
  • Agency: Canon USA Inc IP Division
  • Priority: JP2011-006123 20110114; JP2011-230004 20111019
  • International Application: PCT/JP2012/050660 WO 20120110
  • International Announcement: WO2012/096398 WO 20120719
  • Main IPC: G01J5/02
  • IPC: G01J5/02 G01N21/35 G01J5/08
Terahertz-wave element, terahertz-wave detecting device, terahertz time-domain spectroscopy system, and tomography apparatus
Abstract:
A terahertz-wave element includes a waveguide (2, 4, 5) that includes an electro-optic crystal and allows light to propagate therethrough, and a coupling member (7) that causes a terahertz wave to enter the waveguide (2, 4, 5). The propagation state of the light propagating through the waveguide (2, 4, 5) changes as the terahertz wave enters the waveguide (2, 4, 5) via the coupling member (7).
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