Invention Grant
- Patent Title: Optical measuring apparatuses including polarized beam splitters
- Patent Title (中): 包括偏振分束器的光学测量装置
-
Application No.: US13281656Application Date: 2011-10-26
-
Publication No.: US08736839B2Publication Date: 2014-05-27
- Inventor: Young Heo , Chang Hoon Choi , Byung Seon Chun , Kwang Soo Kim , Tae Joong Kim
- Applicant: Young Heo , Chang Hoon Choi , Byung Seon Chun , Kwang Soo Kim , Tae Joong Kim
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Harness, Dickey & Pierce, PLC
- Priority: KR10-2010-0105450 20101027
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
An optical measuring apparatus may include a light source, linear polarizer, polarized beam splitter, quarter wave plate, objective lens, and/or light receiver. The polarized beam splitter may be configured to transmit linearly polarized light from the linear polarizer to any one of a first and second optical path. The quarter wave plate may be configured to circularly polarize light transmitted through the first optical path from the polarized beam splitter and transmit the circularly polarized light to an object to be measured, and the quarter wave plate may be configured to linearly polarize the circularly polarized light reflected from the object to be measured and transmit the linearly polarized reflected light to the second optical path of the polarized beam splitter. The objective lens may be configured to generate light having different wavelengths by generating chromatic aberration in the circularly polarized light from the quarter wave plate.
Public/Granted literature
- US20120105859A1 Optical Measuring Apparatuses Public/Granted day:2012-05-03
Information query