Invention Grant
US08749791B2 Apparatus and method for measuring optical properties of transparent materials
有权
用于测量透明材料的光学性质的装置和方法
- Patent Title: Apparatus and method for measuring optical properties of transparent materials
- Patent Title (中): 用于测量透明材料的光学性质的装置和方法
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Application No.: US13571210Application Date: 2012-08-09
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Publication No.: US08749791B2Publication Date: 2014-06-10
- Inventor: Severin Wimmer , Peter Schwarz
- Applicant: Severin Wimmer , Peter Schwarz
- Applicant Address: DE
- Assignee: BYK-Gardner GmbH
- Current Assignee: BYK-Gardner GmbH
- Current Assignee Address: DE
- Agency: Hayes Soloway P.C.
- Priority: DE102011053140 20110831
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01J1/04

Abstract:
An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall.
Public/Granted literature
- US20130050684A1 APPARATUS AND METHOD FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT MATERIALS Public/Granted day:2013-02-28
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