Invention Grant
US08761587B2 Apparatus and method for measuring radiation energy during thermal processing 有权
热处理过程中测量辐射能的装置和方法

Apparatus and method for measuring radiation energy during thermal processing
Abstract:
Embodiments of the present invention provide apparatus and method for reducing heating source radiation influence in temperature measurement during thermal processing. In one embodiment of the present invention, background radiant energy, such as an energy source of a thermal processing chamber, is marked within a selected spectrum, a characteristic of the background is then determined by measuring radiant energy at a reference wavelength within the selected spectrum and a comparing wavelength just outside the selected spectrum.
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