Invention Grant
- Patent Title: Ion detection and parameter estimation for N-dimensional data
- Patent Title (中): N维数据的离子检测和参数估计
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Application No.: US13780148Application Date: 2013-02-28
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Publication No.: US08766172B2Publication Date: 2014-07-01
- Inventor: Marc Victor Gorenstein , Guo-Zhong Li
- Applicant: Waters Technologies Corporation
- Applicant Address: US MA Milford
- Assignee: Waters Technologies Corporation
- Current Assignee: Waters Technologies Corporation
- Current Assignee Address: US MA Milford
- Agency: Muirhead and Saturnelli, LLC
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/00 ; G06K9/00
Abstract:
Methods and apparatus for LC/IMS/MS analysis involve obtaining noisy raw data from a sample, convolving the data with an artifact-reducing filter, and locating, in retention-time, ion mobility, and mass-to-charge-ratio dimensions, one or more ion peaks of the convolved data.
Public/Granted literature
- US20140025342A1 ION DETECTION AND PARAMETER ESTIMATION FOR N-DIMENSIONAL DATA Public/Granted day:2014-01-23
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