Invention Grant
- Patent Title: Testing circuits
- Patent Title (中): 测试电路
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Application No.: US13162784Application Date: 2011-06-17
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Publication No.: US08775882B2Publication Date: 2014-07-08
- Inventor: Ajay Kumar Dimri
- Applicant: Ajay Kumar Dimri
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Gardere Wynne Sewell LLP
- Priority: IN3129/DEL/2010 20101228
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A first circuit has a reset input. A second circuit is configured to be reset and provide an output. A test circuit is configured to test the first circuit and second circuit. The test circuit is configured such that a fault with the first circuit and said second circuit is determined in dependence on an output of the first circuit.
Public/Granted literature
- US20120166900A1 TESTING CIRCUITS Public/Granted day:2012-06-28
Information query
