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US08791713B2 Method and apparatus for bypassing silicon bugs 有权
绕过硅虫的方法和装置

Method and apparatus for bypassing silicon bugs
Abstract:
The present invention provides a method and apparatus for bypassing silicon bugs. One exemplary embodiment of the method includes using a logic element formed on a substrate to detect a predefined trigger condition indicating onset of a functional bug during operation of a semiconductor device formed on the substrate. The method also includes modifying operation of the semiconductor device to avoid onset of the functional bug by taking a predefined action associated with the predefined trigger condition.
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