Invention Grant
US08792094B2 Apparatus, system and method for detecting defects of metallic lids 有权
用于检测金属盖缺陷的装置,系统和方法

Apparatus, system and method for detecting defects of metallic lids
Abstract:
An apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, with means for lighting an element to be subjected to examination, an image acquisition unit, and a unit for processing images acquired by said image acquisition unit is described.
Information query
Patent Agency Ranking
0/0