公开(公告)号：US08792094B2

公开(公告)日：2014-07-29

申请号：US13508038

申请日：2010-10-25

Applicant: Massimo Balducci

Inventor： Massimo Balducci

IPC: G01N21/00 ,  G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/909 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2201/06153

Abstract: An apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, with means for lighting an element to be subjected to examination, an image acquisition unit, and a unit for processing images acquired by said image acquisition unit is described.

Abstract translation: 描述用于检测要检查的元件的缺陷的装置，特别是金属盖，具有用于点亮被检查元件的装置，图像获取单元和用于处理由所述图像获取单元获取的图像的单元。

公开(公告)号：US08395767B2

公开(公告)日：2013-03-12

申请号：US13360031

申请日：2012-01-27

Applicant: Massimo Balducci ,  Sanzio Caroli

Inventor： Massimo Balducci ,  Sanzio Caroli

IPC: G01N21/00

CPC classification number: G01N21/8806 ,  G01N21/9036 ,  G01N21/909 ,  G01N21/954

Abstract: The present invention relates to an Apparatus for inspection of concave elements, for detection of contaminations and/or defects, comprising means for lighting a concave element to be subjected to inspection, an image detection unit, such as a camera or like, an optic group and means for processing images acquired by said image detection unit, in order to individuate said contaminations and/or said defects of said concave element, characterized in that said lighting means comprise a first light source, suitable to generate a diffused lighting direct on the concave surface, and a second light source, suitable to generate a grazing lighting directed on the outer lateral surface of said concave element, and in that said optic group is placed so as to detect light emitted by concave surface and transmitting the same to said image detection unit.

Abstract translation: 本发明涉及用于检测污染物和/或缺陷的凹形元件的检测装置，包括用于点亮待检查的凹形元件的装置，诸如照相机等的图像检测单元，光学组 以及用于处理由所述图像检测单元获取的图像的装置，以便对所述凹入元件的所述污染物和/或所述缺陷进行个体化，其特征在于，所述照明装置包括第一光源，适于直接在所述凹部 表面和第二光源，适于产生指向所述凹形元件的外侧表面的放牧照明，并且所述光学组被放置以便检测由凹面发射的光并将其传输到所述图像检测 单元。

公开(公告)号：US20120200849A1

公开(公告)日：2012-08-09

申请号：US13360031

申请日：2012-01-27

Applicant: Massimo Balducci ,  Sanzio Caroli

Inventor： Massimo Balducci ,  Sanzio Caroli

IPC: G01N21/90

CPC classification number: G01N21/8806 ,  G01N21/9036 ,  G01N21/909 ,  G01N21/954

Abstract: The present invention relates to an Apparatus for inspection of concave elements, for detection of contaminations and/or defects, comprising means for lighting a concave element to be subjected to inspection, an image detection unit, such as a camera or like, an optic group and means for processing images acquired by said image detection unit, in order to individuate said contaminations and/or said defects of said concave element, characterized in that said lighting means comprise a first light source, suitable to generate a diffused lighting direct on the concave surface, and a second light source, suitable to generate a grazing lighting directed on the outer lateral surface of said concave element, and in that said optic group is placed so as to detect light emitted by concave surface and transmitting the same to said image detection unit.

Abstract translation: 本发明涉及用于检测污染物和/或缺陷的凹形元件的检测装置，包括用于点亮待检查的凹形元件的装置，诸如照相机等的图像检测单元，光学组 以及用于处理由所述图像检测单元获取的图像的装置，以便对所述凹入元件的所述污染物和/或所述缺陷进行个体化，其特征在于，所述照明装置包括第一光源，适于直接在所述凹部 表面和第二光源，适于产生指向所述凹形元件的外侧表面的放牧照明，并且所述光学组被放置以便检测由凹面发射的光并将其传输到所述图像检测 单元。

公开(公告)号：US20120268733A1

公开(公告)日：2012-10-25

申请号：US13508038

申请日：2010-10-25

Applicant: Massimo Balducci

Inventor： Massimo Balducci

IPC: G01N21/00

CPC classification number: G01N21/8806 ,  G01N21/909 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2201/06153

Abstract: An apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, with means for lighting an element to be subjected to examination, an image acquisition unit, and a unit for processing images acquired by said image acquisition unit is described.

Abstract translation: 描述用于检测要检查的元件的缺陷的装置，特别是金属盖，具有用于点亮被检查元件的装置，图像获取单元和用于处理由所述图像获取单元获取的图像的单元。