Invention Grant
- Patent Title: Scan device for microscope measurement instrument
- Patent Title (中): 扫描仪用于显微镜测量仪器
-
Application No.: US13056293Application Date: 2008-07-31
-
Publication No.: US08796654B2Publication Date: 2014-08-05
- Inventor: Masahiro Ohta , Noriaki Oyabu , Kenjiro Kimura , Shinichiro Ido , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
- Applicant: Masahiro Ohta , Noriaki Oyabu , Kenjiro Kimura , Shinichiro Ido , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
- Applicant Address: JP Kyoto-Shi
- Assignee: Shimadzu Coporation
- Current Assignee: Shimadzu Coporation
- Current Assignee Address: JP Kyoto-Shi
- Agency: Bingham McCutchen LLP
- International Application: PCT/JP2008/002057 WO 20080731
- International Announcement: WO2010/013288 WO 20100204
- Main IPC: G01N21/86
- IPC: G01N21/86 ; G01V8/00 ; G01N35/10 ; G01Q10/06 ; H01J37/20 ; H01J37/26 ; H01J37/28 ; B82Y35/00

Abstract:
A probe needle is successively moved to a plurality of measurement points set in a measurement region on a sample so as to measure a z-displacement amount. An excitation control unit feedback-controls a piezoelectric element so that a vibration amplitude of a cantilever is constant in accordance with the detection output by a displacement detection unit. Moreover, a vertical displacement control unit feedback-controls a vertical position scan unit so as to obtain a constant distance between the probe needle and the sample according to a frequency shift by a frequency detection unit. When changes of outputs of two feedback loops at a certain measurement point are both within a predetermined range, a main control unit issues an instruction to a horizontal position control unit to rapidly move to the next measurement point. As a result, it is possible to adaptively decide such a measurement time that both of the two feedback controls at respective measurement points are established. This eliminates an unnecessary measurement time, which in turn reduces the time required for creating one convex/concave image as compared to the conventional technique and improves the throughput.
Public/Granted literature
- US20110261352A1 Scan Device Public/Granted day:2011-10-27
Information query