Invention Grant
- Patent Title: Film forming method and method for manufacturing film-formation substrate
- Patent Title (中): 成膜方法及其制造方法
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Application No.: US13635177Application Date: 2011-02-28
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Publication No.: US08815352B2Publication Date: 2014-08-26
- Inventor: Tomoya Aoyama , Hisao Ikeda , Satoshi Inoue , Tohru Sonoda
- Applicant: Tomoya Aoyama , Hisao Ikeda , Satoshi Inoue , Tohru Sonoda
- Applicant Address: JP JP
- Assignee: Semiconductor Energy Laboratory Co., Ltd.,Sharp Kabushiki Kaisha
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.,Sharp Kabushiki Kaisha
- Current Assignee Address: JP JP
- Agency: Husch Blackwell LLP
- Priority: JP2010-062710 20100318
- International Application: PCT/JP2011/054531 WO 20110228
- International Announcement: WO2011/114873 WO 20110922
- Main IPC: B05D3/06
- IPC: B05D3/06 ; B05D3/00

Abstract:
One embodiment of the present invention is a film forming method including the steps of forming an absorption layer 12 over one surface of a first substrate 11; forming a layer 16 containing a high molecular compound over the absorption layer; removing an impurity in the layer containing the high molecular compound by performing a first heat treatment on the layer 16; forming a material layer 18 containing a first film formation material and a second film formation material over the layer 16; performing a second heat treatment to form a mixed layer 19 in which the material layer and the layer 16 are mixed over the absorption layer; and performing third heat treatment to form a layer 19a containing the first film formation material and the second film formation material on a film-formation target surface of a second substrate.
Public/Granted literature
- US20130022757A1 Film Forming Method and Method for Manufacturing Film-Formation Substrate Public/Granted day:2013-01-24
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