Invention Grant
US08819511B2 Methods and systems for an automated test configuration to identify logic device defects
有权
用于识别逻辑设备缺陷的自动化测试配置的方法和系统
- Patent Title: Methods and systems for an automated test configuration to identify logic device defects
- Patent Title (中): 用于识别逻辑设备缺陷的自动化测试配置的方法和系统
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Application No.: US13546793Application Date: 2012-07-11
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Publication No.: US08819511B2Publication Date: 2014-08-26
- Inventor: Angel Socarras
- Applicant: Angel Socarras
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
Provided is an apparatus configured for testing a logic device. The apparatus includes a testing mechanism configured to output test patterns representative of logical structures within the logic device and a testable logic device having (i) input ports coupled to output ports of the automated testing mechanism and (ii) output ports coupled to input ports of the automated testing mechanism. The apparatus also includes a fusing mechanism configured to compensate for defects within the logic device responsive to a segregation of the type of defects identified.
Public/Granted literature
- US20130166979A1 Methods and Systems for an Automated Test Configuration to Identify Logic Device Defects Public/Granted day:2013-06-27
Information query
