Invention Grant
- Patent Title: Atmospheric pressure ionization mass spectrometer
- Patent Title (中): 大气压电离质谱仪
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Application No.: US14108715Application Date: 2013-12-17
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Publication No.: US08822915B2Publication Date: 2014-09-02
- Inventor: Kazuo Mukaibatake , Daisuke Okumura
- Applicant: Kazuo Mukaibatake , Daisuke Okumura
- Applicant Address: JP Kyoto-Shi
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto-Shi
- Agency: Bingham McCuthen LLP
- Main IPC: H01J49/42
- IPC: H01J49/42 ; H01J49/06

Abstract:
In a first-stage intermediate vacuum chamber, cluster ions causing a background noise are dominantly formed in area (A), while fragment ions are dominantly generated in area (B). Taking this fact into account, when no in-source CID analysis is performed, voltages applied to the first-stage plate electrode of an ion guide and the exit end of a desolvation tube are adjusted to create an accelerating electric field only in area (A) without creating such a field in area (B). Meanwhile, voltages applied to the electrodes of the ion guide are adjusted to create an electric field for separating ions according to their mobility and selecting a specific ion. Such an operation suppresses the cluster-ion formation, removes ions which originate from impurities and have mass-to-charge ratios close to or equal to those of the ions originating from a target substance, and suppresses the fragment-ion generation. As a result, the target ions are detected with high S/N.
Public/Granted literature
- US20140103206A1 ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER Public/Granted day:2014-04-17
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