Invention Grant
- Patent Title: Charged particle beam drawing apparatus and article manufacturing method using same
- Patent Title (中): 带电粒子束拉制装置及其制造方法
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Application No.: US13412013Application Date: 2012-03-05
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Publication No.: US08822960B2Publication Date: 2014-09-02
- Inventor: Kimitaka Ozawa
- Applicant: Kimitaka Ozawa
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2011-048529 20110307; JP2012-046126 20120302
- Main IPC: H01J37/28
- IPC: H01J37/28

Abstract:
The charged particle beam drawing apparatus of the present invention is a charged particle beam drawing apparatus that renders a pattern on a substrate using a charged particle beam and includes a detector that detects charge amount depending on the irradiation of the charged particle beam; first and second deflectors that are arranged along the direction of the irradiation of the charged particle beam and are capable of deflecting the charged particle beam; and a controller that controls the first and second deflectors, wherein the controller transmits a signal, which is used for switching the irradiation/nonirradiation of the charged particle beam to the detector, to the first and second deflectors at a predetermined timing, and adjusts the operation timing of the first and second deflectors based on the output of the detector depending on the signal.
Public/Granted literature
- US20120228516A1 CHARGED PARTICLE BEAM DRAWING APPARATUS AND ARTICLE MANUFACTURING METHOD USING SAME Public/Granted day:2012-09-13
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