Invention Grant
- Patent Title: Independently based diagnostic monitoring
- Patent Title (中): 独立的诊断监控
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Application No.: US13330664Application Date: 2011-12-19
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Publication No.: US08825446B2Publication Date: 2014-09-02
- Inventor: Karl Friedrich Greb , Sunil Oak , Gerhard Michael Wenderlein
- Applicant: Karl Friedrich Greb , Sunil Oak , Gerhard Michael Wenderlein
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John R. Pressetto; Frederick J. Telecky, Jr.
- Main IPC: G06F11/28
- IPC: G06F11/28 ; G06F11/00 ; G06F11/26

Abstract:
An independently based diagnostic system tests the execution of a processor. The processor is arranged to provide a diagnostic output that provides a pre-determined time-variant signal. The independently based diagnostic system has an independent basis from which to evaluate the pre-determined time-variant signal. The independent basis can be, for example, an independent time base that is separately generated from the processor time base used to clock the processor and/or an independent voltage source that is separate from the processor power supply. The independently based diagnostic system provides progressive notifications of the results of successive evaluations of the pre-determined time-variant signal.
Public/Granted literature
- US20120166880A1 INDEPENDENTLY BASED DIAGNOSTIC MONITORING Public/Granted day:2012-06-28
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