Invention Grant
- Patent Title: Mass spectrometer and mass spectrometry method
- Patent Title (中): 质谱仪和质谱法
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Application No.: US13383371Application Date: 2010-07-09
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Publication No.: US08835834B2Publication Date: 2014-09-16
- Inventor: Masuyuki Sugiyama , Yuichiro Hashimoto , Hisashi Nagano , Hideki Hasegawa , Yasuaki Takada , Masuyoshi Yamada
- Applicant: Masuyuki Sugiyama , Yuichiro Hashimoto , Hisashi Nagano , Hideki Hasegawa , Yasuaki Takada , Masuyoshi Yamada
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2009-166279 20090715
- International Application: PCT/JP2010/004464 WO 20100709
- International Announcement: WO2011/007528 WO 20110120
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00
Abstract:
An object is to measure both cations and anions with high duty cycle. In a mass spectrometer comprising an ion source (1), an ion guide part (31), and an ion trap (32), while ions are being mass-selectively ejected from the ion trap, ions having a polarity reverse to that of the ions trapped in the ion trap are introduced into the ion guide part.
Public/Granted literature
- US20120112059A1 MASS SPECTROMETER AND MASS SPECTROMETRY METHOD Public/Granted day:2012-05-10
Information query
