Invention Grant
- Patent Title: Standard for wavelength and intensity for spectrometers
- Patent Title (中): 光谱仪的波长和强度标准
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Application No.: US12122861Application Date: 2008-05-19
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Publication No.: US08836938B2Publication Date: 2014-09-16
- Inventor: Wilhelm Schebesta , Nico Correns , Lutz Freytag , Michael Rode
- Applicant: Wilhelm Schebesta , Nico Correns , Lutz Freytag , Michael Rode
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Frommer Lawrence & Haug LLP
- Priority: DE102007029405 20070626
- Main IPC: G01J1/10
- IPC: G01J1/10 ; G01N21/27 ; G01N21/35

Abstract:
The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins.
Public/Granted literature
- US20090002696A1 STANDARD FOR WAVELENGTH AND INTENSITY FOR SPECTROMETERS Public/Granted day:2009-01-01
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