Invention Grant
- Patent Title: Optical measurement device and optical measurement method
- Patent Title (中): 光学测量装置和光学测量方法
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Application No.: US13749224Application Date: 2013-01-24
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Publication No.: US08842277B2Publication Date: 2014-09-23
- Inventor: Kenji Goto , Hideaki Yamada
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Global IP Counselors, LLP
- Priority: JP2012-016737 20120130
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
In a first optical measurement device, light which is output from a light source is subject to linear polarizing in a polarizing unit, and is input to a test object A. Transmitted light which has passed through the test object A is orthogonally separated in an orthogonal separation unit, and the light which is orthogonally separated in the orthogonal separation unit is received in two light receiving units. In addition, amount of light of the transmitted light is determined by a control unit, and a difference between received light levels which are received in the light receiving unit is normalized using the amount of light which is determined in a transmitted amount of light determination unit, and then the angle of optical rotation is calculated by the angle of optical rotation calculation unit.
Public/Granted literature
- US20130194572A1 OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD Public/Granted day:2013-08-01
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