Invention Grant
- Patent Title: Analysis apparatus and analysis method
- Patent Title (中): 分析仪器及分析方法
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Application No.: US13839748Application Date: 2013-03-15
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Publication No.: US08879062B2Publication Date: 2014-11-04
- Inventor: Yuji Ikeda
- Applicant: Imagineering, Inc.
- Applicant Address: JP Hyogo
- Assignee: Imagineering, Inc.
- Current Assignee: Imagineering, Inc.
- Current Assignee Address: JP Hyogo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2010-207384 20100915
- Main IPC: G01J3/30
- IPC: G01J3/30 ; G01N21/71 ; G01N21/68 ; G01N21/73

Abstract:
An analysis apparatus includes a plasma generation unit and an optical analysis unit. The plasma generation unit generates initial plasma by momentarily energizing a target substance to be turned into a plasma state, and maintains the target substance in the plasma state by irradiating the initial plasma with an electromagnetic wave for a predetermined period of time. The optical analysis unit identifies the target substance based on information with respect to emission intensity during a period from when the emission intensity reaches a peak due to the initial plasma until when the emission intensity increases and reaches approximately a constant value due to electromagnetic wave plasma maintained by the electromagnetic wave, or information with respect to emission intensity after the electromagnetic wave irradiation is terminated.
Public/Granted literature
- US20130208274A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2013-08-15
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