Invention Grant
- Patent Title: Harmonic derived arc detector
- Patent Title (中): 谐波导出电弧检测器
-
Application No.: US12764145Application Date: 2010-04-21
-
Publication No.: US08890537B2Publication Date: 2014-11-18
- Inventor: John Valcore, Jr. , Yufeng Han , Jonathan Smyka , Salvatore Polizzo , Aaron T. Radomski
- Applicant: John Valcore, Jr. , Yufeng Han , Jonathan Smyka , Salvatore Polizzo , Aaron T. Radomski
- Applicant Address: US MA Andover
- Assignee: MKS Instruments, Inc.
- Current Assignee: MKS Instruments, Inc.
- Current Assignee Address: US MA Andover
- Agency: Harness, Dickey & Pierce, P.L.C.
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H05H1/00 ; H01J37/32

Abstract:
An arc detection system includes a radio frequency (RF) signal probe that senses a RF signal at an input of a RF plasma chamber and that generates a signal based on at least one of the voltage, current, and power of the RF signal. A signal analyzer receives the signal, monitors the signal for frequency components that have a frequency greater than or equal to a fundamental frequency of the RF signal, and generates an output signal based on the frequency components. The output signal indicates that an arc is occurring in the RF plasma chamber.
Public/Granted literature
- US20100201371A1 Harmonic Derived Arc Detector Public/Granted day:2010-08-12
Information query