Invention Grant
- Patent Title: Light distribution characteristic measurement apparatus and light distribution characteristic measurement method
- Patent Title (中): 配光特性测量装置和配光特性测量方法
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Application No.: US13771084Application Date: 2013-02-20
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Publication No.: US08896823B2Publication Date: 2014-11-25
- Inventor: Yoshi Enami
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Hirakata-Shi
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Hirakata-Shi
- Agency: Mori & Ward, LLP
- Priority: JP2012-085508 20120404
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01J1/42 ; G01J1/04 ; G01J1/02 ; G01J3/50 ; G01J3/51

Abstract:
A light distribution characteristic measurement apparatus for measuring the light distribution characteristic of a light source is provided. The apparatus includes a plurality of detectors arranged so that they have a predetermined relative relationship with each other. One detector has a detection range at least partially overlapping a detection range of another detector adjacent to the former detector. The apparatus further includes a drive unit that drives a plurality of detectors as one unit to update a positional relationship of the plurality of detectors relative to the light source, and a calculation unit that calculates the light distribution characteristic of the light source by performing a process depending on at least one of a relative relationship between a plurality of detectors and overlapping of respective detection ranges thereof, based on respective results of detection that have been acquired by the plurality of detectors at the same timing.
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