Invention Grant
- Patent Title: Particle beam device having a detector arrangement
- Patent Title (中): 具有检测器装置的粒子束装置
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Application No.: US13430913Application Date: 2012-03-27
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Publication No.: US08901510B2Publication Date: 2014-12-02
- Inventor: Dietmar Dönitz , Christian Wagner
- Applicant: Dietmar Dönitz , Christian Wagner
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Muirhead and Saturnelli, LLC
- Priority: DE102011006588 20110331
- Main IPC: G21K1/08
- IPC: G21K1/08 ; H01J37/28

Abstract:
A particle beam device has a first column with a first beam axis, the first column having a first particle beam generator and a first objective lens for focusing the first particle beam on an object. A second column with a second beam axis is provided, the second column having a second particle beam generator and a second objective lens for focusing the second particle beam on the object. A detector, having a detection axis, detects interacting particles and/or radiation. The first beam axis and the second beam axis define a first angle, different from 0° and from 180°. The first and second beam axes are situated in a first plane. The detection axis of the detector and the first beam axis are situated in a second plane. The first plane and the second plane define a second angle having an absolute value in the range of 65° to 80°.
Public/Granted literature
- US20120286159A1 PARTICLE BEAM DEVICE HAVING A DETECTOR ARRANGEMENT Public/Granted day:2012-11-15
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