Invention Grant
- Patent Title: Enhanced scanner throughput system and method
- Patent Title (中): 增强扫描仪吞吐量系统和方法
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Application No.: US13473695Application Date: 2012-05-17
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Publication No.: US08906599B2Publication Date: 2014-12-09
- Inventor: Yu-Mei Liu , Chin-Hsiang Lin , Heng-Hsin Liu , Heng-Jen Lee , I-Hsiung Huang , Chih-Wei Lin
- Applicant: Yu-Mei Liu , Chin-Hsiang Lin , Heng-Hsin Liu , Heng-Jen Lee , I-Hsiung Huang , Chih-Wei Lin
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A method and system to improve scanner throughput is provided. An image from a reticle is projected onto a substrate using a continuous linear scanning procedure in which an entire column of die or cells of die is scanned continuously, i.e. without stepping to a different location. Each scan includes translating a substrate with respect to a fixed beam. While the substrate is translated, the reticle is also translated. When a first die or cell of die is projected onto the substrate, the reticle translates along a direction opposite the scan direction and as the scan continues along the same direction, the reticle then translates in the opposite direction of the substrate thereby forming an inverted pattern on the next die or cell. The time associated with exposing the substrate is minimized as the stepping operation only occurs after a complete column of cells is scanned.
Public/Granted literature
- US20130309612A1 ENHANCED SCANNER THROUGHPUT SYSTEM AND METHOD Public/Granted day:2013-11-21
Information query
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