Invention Grant
- Patent Title: Shielding design for metal gap fill
- Patent Title (中): 金属间隙填充屏蔽设计
-
Application No.: US13355770Application Date: 2012-01-23
-
Publication No.: US08926806B2Publication Date: 2015-01-06
- Inventor: Ming-Chin Tsai , Bo-Hung Lin , You-Hua Chou , Chung-En Kao
- Applicant: Ming-Chin Tsai , Bo-Hung Lin , You-Hua Chou , Chung-En Kao
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Associates, LLC
- Main IPC: C23C14/22
- IPC: C23C14/22 ; C23C14/58

Abstract:
The present disclosure is directed to a physical vapor deposition system configured to heat a semiconductor substrate or wafer. In some embodiments the disclosed physical vapor deposition system comprises at least one heat source having one or more lamp modules for heating of the substrate. The lamp modules may be separated from the substrate by a shielding device. In some embodiments, the shielding device comprises a one-piece device or a two piece device. The disclosed physical vapor deposition system can heat the semiconductor substrate, reflowing a metal film deposited thereon without the necessity for separate chambers, thereby decreasing process time, requiring less thermal budget, and decreasing substrate damage.
Public/Granted literature
- US20130186338A1 Shielding Design for Metal Gap Fill Public/Granted day:2013-07-25
Information query
IPC分类: