Invention Grant
- Patent Title: Method and device for measuring electromagnetic wave
- Patent Title (中): 测量电磁波的方法和装置
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Application No.: US13954116Application Date: 2013-07-30
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Publication No.: US08954286B2Publication Date: 2015-02-10
- Inventor: Michinori Shioda
- Applicant: Canon Kabushiki Kaisha
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-002482 20100108
- Main IPC: G01R23/16
- IPC: G01R23/16 ; G01J5/10 ; G01J3/28 ; G06K9/00 ; G01N21/3581 ; G06K9/62

Abstract:
A waveform acquiring unit acquires a time waveform of an electromagnetic wave. The time waveform is decomposed into wavelet expansion coefficients by wavelet transform. Influence levels of the respective wavelet expansion coefficients to a spectrum are calculated. The wavelet expansion coefficients are weighted based on at least the influence levels of the wavelet expansion coefficients to the spectrum. The weighted wavelet expansion coefficients are converted into time waveforms by inverse wavelet transform. Thus, the time waveforms that holds spectrum information needed for spectroscopic analysis and has a reduced noise is provided.
Public/Granted literature
- US20130313435A1 METHOD AND DEVICE FOR MEASURING ELECTROMAGNETIC WAVE Public/Granted day:2013-11-28
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