Invention Grant
US08969804B2 Device for analyzing a sample using radiation in the terahertz frequency range
有权
用于使用太赫兹频率范围内的辐射分析样本的装置
- Patent Title: Device for analyzing a sample using radiation in the terahertz frequency range
- Patent Title (中): 用于使用太赫兹频率范围内的辐射分析样本的装置
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Application No.: US13578778Application Date: 2011-02-07
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Publication No.: US08969804B2Publication Date: 2015-03-03
- Inventor: Lorenzo Tripodi , Jaime Gomez Rivas , Ullrich Richard Rudolf Pfeiffer , Peter Gunther Haring Bolivar
- Applicant: Lorenzo Tripodi , Jaime Gomez Rivas , Ullrich Richard Rudolf Pfeiffer , Peter Gunther Haring Bolivar
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP10153566 20100215
- International Application: PCT/IB2011/050511 WO 20110207
- International Announcement: WO2011/098943 WO 20110818
- Main IPC: G01J5/20
- IPC: G01J5/20 ; G01N21/3581 ; G01N21/552 ; G01N21/3563 ; G02B6/122
Abstract:
A device for analyzing a sample using radiation in the terahertz frequency range is provided. The device comprises a transmitter (3) comprising a THz signal generator (5, 6, 7; 51) for generating an electromagnetic THz signal, the THz signal generator comprising a nonlinear transmission line (7; 52). The device further comprises a surface plasmon polariton generating unit (8) adapted to convert the THz signal into a surface plasmon polariton. The transmitter (3) and the surface plamon polariton generating unit (8) are either integrated on one common substrate or on two separate substrates.
Public/Granted literature
- US20120305772A1 DEVICE FOR ANALYZING A SAMPLE USING RADIATION IN THE TERAHERTZ FREQUENCY RANGE Public/Granted day:2012-12-06
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