Invention Grant
- Patent Title: System for measuring light intensity distribution
- Patent Title (中): 用于测量光强分布的系统
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Application No.: US13729285Application Date: 2012-12-28
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Publication No.: US08981319B2Publication Date: 2015-03-17
- Inventor: Jun Zhu , Jing-Lei Zhu , Kai-Li Jiang , Chen Feng , Ji-Qing Wei , Guo-Fan Jin , Shou-Shan Fan
- Applicant: Tsinghua University , Hon Hai Precision Industry Co., Ltd.
- Applicant Address: CN Beijing TW New Taipei
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Beijing TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN2012101920632 20120612
- Main IPC: G01J1/58
- IPC: G01J1/58 ; G01J1/42 ; G01J1/04 ; G01J1/08

Abstract:
A system for measuring intensity distribution of light includes a carbon nanotube array located on a surface of a substrate, a reflector and an imaging element. The carbon nanotube array absorbs photons of a light source and radiates a visible light. The reflector is used to reflect the visible light, and the reflector is spaced from the carbon nanotube array. The carbon nanotube array is located between the reflector and the substrate. The imaging element is used to image the visible light. The imaging element is spaced from the substrate.
Public/Granted literature
- US20130327960A1 SYSTEM FOR MEASURING LIGHT INTENSITY DISTRIBUTION Public/Granted day:2013-12-12
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